• DocumentCode
    1948027
  • Title

    Selective one-step plasma patterning process for fluidic self-assembly of silicon chips

  • Author

    Bock, Karlheinz ; Scherbaum, Sabine ; Yacoub-George, Erwin ; Landesberger, Christof

  • Author_Institution
    Fraunhofer-Inst. for Reliability & Microintegration, Munich
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1099
  • Lastpage
    1104
  • Abstract
    Applying a tetrafluoromethane (CF4) low pressure plasma process to the surface of a polymeric foil with a structured thin film copper layer on top results in an opposed wettability behavior of metal areas and polymer areas. Difference in the local water contact angle between the hydrophobic polymer and the hydrophilic copper after a maskless CF4 plasma treatment is 95deg-105deg. By storing the plasma treated foils under nitrogen their programmed wetting behavior can be preserved for at least ten day. The special wetting properties of surface energy patterned foils favor them as substrate materials in fluidic self assembly processes. Self alignment of small and thin silicon chips on copper bonding sites on polyimide foils was observed. Specific design patterns are proposed that enable both bonding of dies at dedicated target positions and electrical interconnects at front side or rear side of electronic components with two connection pads. Using a droplet of water as assembly medium and an anisotropic conductive adhesive (ACA) coating lead to successfully assembled test chips on patterned polyimide foils that were pre-treated in the selective one-step CF4 plasma.
  • Keywords
    conductive adhesives; contact angle; copper; elemental semiconductors; fluidics; foils; metallic thin films; microassembling; monolithic integrated circuits; plasma materials processing; polymers; self-assembly; silicon; surface energy; surface treatment; wetting; anisotropic conductive adhesive coating; connection pads; dies bonding; electronic components; fluidic self-assembly; local water contact angle; low pressure plasma; polyimide; polymeric foil; selective one-step plasma patterning; silicon chips; surface energy; test chips; tetrafluoromethane; thin film copper layer; wettability; Assembly; Bonding; Copper; Nitrogen; Plasma materials processing; Plasma properties; Polyimides; Polymer films; Self-assembly; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550112
  • Filename
    4550112