DocumentCode :
1948169
Title :
Analysis of copper treatments and the effects on signal propagation
Author :
Pytel, Steven G. ; Huray, P.G. ; Hall, S.H. ; Mellitz, R.I. ; Brist, G.
Author_Institution :
Intel Corp., Columbia, SC
fYear :
2008
fDate :
27-30 May 2008
Firstpage :
1144
Lastpage :
1149
Abstract :
As computer data rates increase into the 30 - 50 Gb/s range fundamental material challenges emerge that make it difficult to design a robust electrical interconnect between the transmitter and receiver. This paper discusses the effects of differing copper treatments and the effects these treatments have on signal propagation for a computer electrical interconnect. Two types of treatments have been studied: high profile copper (HPC) and low profile copper (LPC). Discussions on the physical surface geometry and elemental analyses of these copper types along with their signaling effects are discussed below.
Keywords :
copper; integrated circuit interconnections; receivers; signal processing; transmitters; Cu; computer electrical interconnect; copper treatment; high profile copper; low profile copper; physical surface geometry; receiver; signal propagation; signaling effects; transmitter; Cathodes; Copper; Detectors; Dielectrics; Integrated circuit interconnections; Rough surfaces; Scanning electron microscopy; Signal analysis; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2008.4550120
Filename :
4550120
Link To Document :
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