DocumentCode :
1948182
Title :
Desien for testability - Session 10
fYear :
2004
fDate :
3-6 Oct. 2004
Firstpage :
195
Lastpage :
195
Keywords :
Bandwidth; Circuit optimization; Circuit testing; Clocks; Complexity theory; Costs; Design for testability; Semiconductor device manufacture; Semiconductor device testing; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN :
0-7803-8495-4
Type :
conf
DOI :
10.1109/CICC.2004.1358774
Filename :
1358774
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1948182
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