Title :
Status and Trends in Silicon RF Technology
Author :
Burghartz, Joachim N.
Author_Institution :
Delft University of Technology, The Netherlands
Keywords :
BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Crosstalk; Energy consumption; Micromachining; Noise figure; Packaging; Radio frequency; Silicon;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
