DocumentCode :
1948300
Title :
Technology investigation on developing fit garment patterns with different size in 2D and 3D CAD system
Author :
Yunchu, Yang
Author_Institution :
Fashion Inst., Zhejiang Sci-Tech Univ., Hangzhou, China
Volume :
1
fYear :
2010
fDate :
17-19 Nov. 2010
Firstpage :
744
Lastpage :
748
Abstract :
In order to customize different size garment patterns, several methods in computer aided design system can be adopted. Traditional grading technology in 2D CAD and new parametrical body modeling technology in 3D CAD were introduced in the paper. The main grading methods include point grading, rule table grading, cut-line grading and parametric grading. The principles and characteristics of these methods were outlined combined with a typical 2D system (Richpeace) in the Chinese market. In 3D system, mannequin or garment parametrical modeling is most important precondition for developing individual garment patterns. Several novel researches about parameterization approach are reviewed. Finally, a pattern customizing case on a fit pants with four different size was implemented based on 3D modeling technology.
Keywords :
CAD; clothing; product customisation; production engineering computing; solid modelling; 2D CAD System; 3D CAD System; Chinese market; computer aided design system; cut-line grading; different size garment patterns; fit garment patterns; garment parametrical modeling; parametric grading; pattern customizing case; point grading; rule table grading; Computational modeling; Design automation; Hip; Solid modeling; Three dimensional displays; component; garment CAD; grading technology; parametrical body modeling; pattern;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Industrial Design & Conceptual Design (CAIDCD), 2010 IEEE 11th International Conference on
Conference_Location :
Yiwu
Print_ISBN :
978-1-4244-7973-3
Type :
conf
DOI :
10.1109/CAIDCD.2010.5681241
Filename :
5681241
Link To Document :
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