• DocumentCode
    1948454
  • Title

    Microwave design & characterization of a novel Nano-Cu based ultra-fine pitch chip-to-package interconnect

  • Author

    Bandyopadhyay, Tapobrata ; Mehrotra, Gaurav ; Iyer, Mahadevan K. ; Raj, P.M. ; Swaminathan, Madhavan ; Tummala, Rao R.

  • Author_Institution
    Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1242
  • Lastpage
    1248
  • Abstract
    This paper presents design and characterization of nano-Cu based ultra-fine pitch chip-to-package interconnects for microwave frequencies. Transitions are designed with this new interconnect and characterized up to 40 GHz in packaging configurations such as chip-on-chip and chip-on-package.
  • Keywords
    copper; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; microwave integrated circuits; Cu; chip-on-chip; frequency 40 GHz; microwave design; microwave frequencies; packaging configurations; ultra-fine pitch chip-to-package interconnect; CMOS technology; Copper; Electronic equipment testing; Electronics packaging; Frequency; Parametric study; Parasitic capacitance; Semiconductor device measurement; System testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550134
  • Filename
    4550134