• DocumentCode
    1948521
  • Title

    Development of novel, flexible, electrically conductive adhesives for next-generation microelectronics interconnect applications

  • Author

    Li, Yi ; Yim, M.J. ; Moon, K. ; Zhang, R.W. ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1272
  • Lastpage
    1276
  • Abstract
    In this paper, a novel flexible electrically conductive adhesive (FECA) has been designed for electronic interconnect applications that require high flexibility at the interconnects, such as assembly and repair of flexible circuits on flexible substrates and connectors. The physical properties of the resulting FECAs such as the elastic moduli, glass transition temperatures, adhesion strength and electrical properties were characterized by differential scanning calorimetry (DSC), dynamic mechanical analyzer (DMA), thermomechanical analyzer (TMA), die shear tester and multimeter electrical measurement. A high performance FECA with tunable modulus, flowability, glass transition temperature, electrical conductivity and adhesion strength was developed for the next-generation large scale flexible flat panel displays applications.
  • Keywords
    calorimetry; conductive adhesives; electrical conductivity; integrated circuit interconnections; integrated circuits; adhesion strength; die shear tester; differential scanning calorimetry; dynamic mechanical analyzer; elastic moduli; electrical conductivity; electrically conductive adhesives; glass transition temperatures; microelectronics interconnect applications; multimeter electrical measurement; thermomechanical analyzer; Assembly; Calorimetry; Conductive adhesives; Connectors; Flexible printed circuits; Glass; Integrated circuit interconnections; Mechanical factors; Microelectronics; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550138
  • Filename
    4550138