DocumentCode
1948569
Title
Multi-walled carbon nanotube/nanocrystalline copper nanocomposite film as an interconnect material
Author
Yoo, Jung Joon ; Song, Jae Yong ; Yu, Jin ; Lyeo, Ho Ki ; Lee, Sungjun ; Hahn, Jun Hee
Author_Institution
Dept. of Mater. Sci. & Eng., KAIST, Daejeon
fYear
2008
fDate
27-30 May 2008
Firstpage
1282
Lastpage
1286
Abstract
We fabricated nanocomposite films comprising multi- walled carbon nanotubes (MWCNTs, diameter 10~40 nm, length > 1 mum) and nanocrystalline copper using a low cost electrochemical method. Owing to pulse deposition with several additives, MWCNTs were well-dispersed in the films through thickness and the nanocomposite films showed a dense structure without any voids. For the purpose of evaluation as a candidate for electronic interconnection, elastic modulus, hardness, electrical resistivity, and thermal conductivity of MWCNT/Cu nanocomposite films were measured using nanoindentation, four probe, and time-domain thermo-reflectance methods. It was found that the mechanical properties were more or less enhanced due to the addition of MWCNTs but electrical and thermal conductivities of nanocomposite films were drastically decreased. Further studies are needed for the application of electroplated MWCNT/Cu nanocomposite films as next generation interconnecting materials of electronic devices.
Keywords
carbon nanotubes; copper; elastic moduli; electrical resistivity; hardness; nanocomposites; thermal conductivity; C-Cu; elastic modulus; electrical resistivity; electrochemical method; electronic interconnection; hardness; interconnect material; multiwalled carbon nanotube/nanocrystalline copper nanocomposite film; nanocomposite films; thermal conductivity; time-domain thermo-reflectance methods; Additives; Carbon nanotubes; Conductive films; Copper; Costs; Electric resistance; Nanostructured materials; Organic materials; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550140
Filename
4550140
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