DocumentCode
1948832
Title
Packaging the Cell Broadband Engine microprocessor for supercomputer applications
Author
Harvey, P. ; Mandrekar, R. ; Zhou, Y. ; Zheng, J. ; Maloney, J. ; Cain, S. ; Kawasaki, K. ; Lafontant, G. ; Noma, H. ; Imming, K. ; Plachy, T. ; Questad, D.
Author_Institution
IBM Syst. & Technol. Group, Austin, TX
fYear
2008
fDate
27-30 May 2008
Firstpage
1368
Lastpage
1371
Abstract
The Cell Broadband Enginetrade (Cell BE) processor initially designed for high-end consumer electronics, has been enhanced by IBM for supercomputer applications. The enhancements to the chip also necessitated the design and development of a new package. The modifications to the chip included replacement of the 3.2 Gb/s XDR interface with a 800 Mb/s DDR2 interface of equal bandwidth. This required the addition of several hundred chip-level connections (C4´s) and package BGA balls. Incorporating this and other enhancements to the chip resulted in a ~20% larger chip and a larger and more complex package. Additional noise from this large memory interface also drove decoupling requirements that necessitated mounting capacitors on both the top and bottom sides of the package. This paper describes the design of this new package as well as the analysis and characterization techniques used to address the packaging concerns outlined above. It includes a comprehensive noise analysis as well as a thorough characterization of the DDR2 interface in the final prototypes. The paper also outlines the design and analysis of the power distribution to the various voltage domains on the chip. Along with electrical design and performance, the paper also includes finite element modeling of the mechanical stresses resident in this FCPBGA package. Finally, the concluding portions of the paper will discuss the trade-offs between electrical performance and mechanical stability, reliability and relative cost.
Keywords
ball grid arrays; finite element analysis; integrated circuit interconnections; integrated circuit noise; integrated circuit packaging; integrated circuit reliability; mechanical stability; microprocessor chips; parallel machines; DDR2 interface; FCPBGA package; cell broadband engine microprocessor; chip-level connections; electrical design; finite element modeling; large memory interface; mechanical stability; mechanical stress; noise analysis; package BGA balls; power distribution; reliability; supercomputer application; Bandwidth; Capacitors; Consumer electronics; Electronics packaging; Engines; Microprocessors; Power distribution; Process design; Prototypes; Supercomputers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550154
Filename
4550154
Link To Document