Title :
High speed digital signal analysis of ultra-broadband micromachined flip-chip interconnect designs
Author :
Cho, Young Seek ; Drayton, Rhonda Franklin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN
Abstract :
Multi-gigabits digital signal transmission in flip-chip interconnect is studied. It is indicated that a conventional flip-chip (CFC) interconnect has two distinct problems. Adding two micromachined features, air cavity and trenches, can improve the transmission characteristic of the CFC interconnect, which is called locally matched flip-chip (LMFC) interconnect. The measured S-parameters, which are the parameters in the frequency domain, show that the LMFC interconnect has the bandwidth of return loss below 20 dB up to 50 GHz. Based on the frequency domain response, the CFC and LMFC flip-chip interconnects are characterized in the time domain using eye-diagram. The simulated eye-diagram performance of the LMFC interconnect indicates that introducing the air cavity and trench to the CFC interconnect improves the multi-gigabits digital signal transmission significantly and the LMFC interconnect could operate at 40 Gb/s bit rate.
Keywords :
S-parameters; digital communication; flip-chip devices; frequency-domain analysis; integrated circuit design; integrated circuit interconnections; micromechanical devices; time-domain analysis; S-parameters; air cavity; bit rate 40 Gbit/s; conventional flip-chip interconnect; eye-diagram performance; frequency domain; high speed digital signal analysis; multigigabits digital signal transmission; time domain; ultrabroadband micromachined flip-chip interconnect designs; Bandwidth; Coplanar waveguides; Frequency domain analysis; Impedance; Integrated circuit interconnections; Optical waveguides; Packaging; Signal analysis; Signal design; Silicon;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550155