DocumentCode
1948872
Title
Method for improved thermal performance of flip chip on flex power devices
Author
Vaccaro, Brian ; Osenbach, John ; Bachman, Mark ; Amin, Ahmed ; Crouthamel, Dave ; Shilling, Tom ; Thomas, Ebyson
Author_Institution
LSI Corp., Allentown, PA
fYear
2008
fDate
27-30 May 2008
Firstpage
1378
Lastpage
1384
Abstract
A thermal solution for flip chip preamp die on flex applications was realized via a new flex design. This design incorporates an opening in the flex circuit under the center region of the preamp die thus removing the low thermal conductivity flex materials and exposing the aluminum stiffener plate. The surface of the aluminum stiffener plate is modified by zincation followed by electrolytic Ni, immersion Sn plating. This provides a solderable surface that readily forms a metallurgical bond with solder. Thermal solder bumps that are of order 5X the volume of the electrical bumps are added to the center region of the preamp die which resides above the opening in the flex circuit. The thermal bumps are formed at the same time the electrical bumps are formed with only a UBM and solder bump mask change. Using a conventional reflow assembly process, both the peripheral signal bumps and thermal bumps are attached to the flex circuit thus creating a high conductivity thermal path from the die directly to the metal stiffener plate. The assembly is completed using the standard underfill process. Prototype flex circuit assemblies with this new design as well as the standard design were assembled and characterized for thermal performance. Detailed thermal modeling was performed for both cases and the results are consistent with the experimental findings. Finally, a detailed construction analysis was performed utilizing cross-sectioning techniques and both optical and scanning electron microscopy to verify the assembly structure. This analysis revealed the importance of forming a metallurgical bond between the thermal bump and the Al-stiffener plate.
Keywords
aluminium; assembling; flexible electronics; flip-chip devices; nickel; optical microscopy; preamplifiers; reflow soldering; scanning electron microscopy; thermal conductivity; tin; Al; Ni; Sn; aluminum stiffener plate; electrical bumps; electrolytic Ni; flex circuit; flex power devices; flip chip devices; flip chip preamp die; immersion Sn plating; metallurgical bond; optical microscopy; peripheral signal bumps; reflow assembly process; scanning electron microscopy; thermal conductivity path; thermal performance; thermal solder bumps; zincation; Aluminum; Assembly; Bonding; Conducting materials; Flexible electronics; Flip chip; Optical microscopy; Signal processing; Thermal conductivity; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550156
Filename
4550156
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