DocumentCode :
1948953
Title :
An electrically robust method for placing power gating switches in voltage islands
Author :
Kozhaya, Joseph N. ; Bakir, Lu´Ay A.
Author_Institution :
IBM Microeletronics, Essex Junction, VT, USA
fYear :
2004
fDate :
3-6 Oct. 2004
Firstpage :
321
Lastpage :
324
Abstract :
Leakage power is quickly becoming a major design concern in modern VLSI chips. One design technique that allows the efficient control and reduction of leakage power involves using voltage islands which can be selectively turned on or off. Power gating switches are huge transistors which connect the voltage island and chip power grids. The power gating switches are turned off to disconnect the power supply from the voltage island when in "idle" or "sleep" state; thus reducing leakage power dissipation. In this paper, we present an efficient and automated algorithm for placing power gating switches in voltage islands so as to meet the electrical requirements of the design while guaranteeing the design specifications of the switches and minimizing their area overhead. Experimental results illustrate the efficiency of the proposed approach in determining an electrically robust placement of power gating switches.
Keywords :
VLSI; circuit layout CAD; circuit simulation; integrated circuit design; leakage currents; low-power electronics; power semiconductor switches; power supply circuits; power transistors; VLSI chip design; automated placement algorithm; chip power grids; design specifications; electrical requirements; electrically robust placement; idle state; leakage power; leakage power dissipation; power gating switch transistors; power gating switches; power supply disconnection; sleep state; sleep transistor; switch area overhead; voltage islands; Algorithm design and analysis; Integrated circuit technology; Maintenance; Power dissipation; Power grids; Power supplies; Power systems; Robustness; Switches; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN :
0-7803-8495-4
Type :
conf
DOI :
10.1109/CICC.2004.1358810
Filename :
1358810
Link To Document :
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