• DocumentCode
    1948955
  • Title

    Tin/silver/copper alloy nanoparticle pastes for low temperature lead-free interconnect applications

  • Author

    Jiang, Hongjin ; Moon, Kyoung-Sik ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng. & Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1400
  • Lastpage
    1404
  • Abstract
    Chemical reduction methods were used to synthesize tin/silver/copper (SnAgCu) alloy nanoparticles with various sizes. The thermal properties of the SnAgCu alloy nanoparticles were studied by differential scanning calorimetry. Both the particle size dependent melting temperature and latent heat of fusion have been observed. The as-synthesized SnAgCu alloy nanoparticles were dispersed into an acidic type flux to form the nano solder pastes. Their wetting properties on the cleaned copper surface were studied. It was found that the nanoparticle pastes completely melted and wetted on the copper surface and the tin and copper intermetallic compounds formed. These low melting point SnAgCu alloy nanoparticles could be used for low temperature lead-free interconnect applications.
  • Keywords
    copper alloys; differential scanning calorimetry; heat of fusion; melting point; nanoparticles; particle size; reduction (chemical); silver alloys; solders; tin alloys; wetting; Cu; SnAgCu; chemical reduction methods; differential scanning calorimetry; heat of fusion; lead-free interconnect applications; melting temperature; particle size; solder; tin/silver/copper alloy nanoparticle pastes; wetting; Calorimetry; Chemicals; Copper alloys; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Nanoparticles; Silver; Temperature dependence; Tin alloys;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550160
  • Filename
    4550160