Diode particle simulations in 2-D and 3-D geometries by using LSP and MCNP code

Author

Han, S.H. ; Beak, S.H. ; Hong, S.H. ; Song, S.Y. ; Lee, J.

Author_Institution

Agency for Defense Dev., Daejeon, South Korea

fYear

2011

fDate

19-23 June 2011

Firstpage

1138

Lastpage

1141

Abstract

When test explosives are irradiated by flash X-ray, the dynamic properties can be analyzed by observing crack progress and fracture movement. Our radiographic device has a self-magnetic pinched(SMP) diode to generate flash X-ray. To optimize diode performance the SMP diode is simulated with the combination of LSP and MCNP code. The electron particle data are extracted at anode position of the diode by LSP particle-in-cell(PIC) code. When these electrons collide with the tantalum target Bremsstrahlung photons are produced, which can be calculated by the MCNP Monte-Carlo code. We discovered some of 2-D simulation results did not matched real situation, that is, electron energy spectra had a too high energy tail and electron spatial distribution was excessively focused at the axis of anode position. We tried the 3-D diode simulation and compared the results with that of 2-D geometry.

Keywords

Monte Carlo methods; X-ray apparatus; diodes; explosives; geometry; photons; 2D geometries; 3D diode simulation; 3D geometries; LSP PIC code; LSP particle-in-cell code; MCNP Monte-Carlo code; SMP diode; crack progress; diode particle simulations; electron energy spectra; electron particle data; flash X-ray; fracture movement; radiographic device; self-magnetic pinched diode; tantalum target Bremsstrahlung photons; test explosives; Geometry; Irrigation; Physics;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference (PPC), 2011 IEEE

Conference_Location

Chicago, IL

ISSN

2158-4915

Print_ISBN

978-1-4577-0629-5

Type

conf

DOI

10.1109/PPC.2011.6191569

Filename

6191569