DocumentCode :
1949202
Title :
Initial state opacity in stochastic DES
Author :
Keroglou, C. ; Hadjicostis, Christoforos N.
Author_Institution :
ECE Dept., Univ. of Cyprus, Nicosia, Cyprus
fYear :
2013
fDate :
10-13 Sept. 2013
Firstpage :
1
Lastpage :
8
Abstract :
A non-deterministic finite automaton is initial-state opaque if the membership of its true initial state to a given set of secret states S remains opaque (i.e., uncertain) to an intruder who observes system activity through some natural projection map. By establishing that the verification of initial state opacity is equivalent to the language containment problem, earlier work has established that the verification of initial state opacity is a PSPACE-complete problem. In this paper, motivated by the desire to incorporate probabilistic (likelihood) information, we extend the notion of initial state opacity to stochastic discrete event systems. Specifically, we consider systems that can be modeled as probabilistic finite automata, and introduce and analyze the notions of almost initial state opacity and step-based almost initial state opacity, both of which hinge on the a priori probability that the given system generate behavior that violates initial-state opacity. We also discuss how almost initial state opacity and step-based almost initial state opacity can be verified, and analyze the complexity of the proposed verification methods.
Keywords :
computational complexity; discrete event systems; finite automata; probabilistic automata; probability; state estimation; stochastic systems; a priori probability; complexity; probabilistic finite automata; probabilistic likelihood information; security notion; step-based almost initial state opacity; stochastic DES; stochastic discrete event systems; verification methods; Automata; Complexity theory; Discrete-event systems; ISO; Probabilistic logic; Security; Stochastic processes; Initial state opacity; probabilistic automata; security and privacy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2013 IEEE 18th Conference on
Conference_Location :
Cagliari
ISSN :
1946-0740
Print_ISBN :
978-1-4799-0862-2
Type :
conf
DOI :
10.1109/ETFA.2013.6648005
Filename :
6648005
Link To Document :
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