DocumentCode :
1949270
Title :
An Soi Performance Sizing Using Transient Finite-Element Modeling
Author :
Mandelman, J.A.
Author_Institution :
IBM Technology Products, Essex Junction, VT
fYear :
1992
fDate :
6-8 Oct. 1992
Firstpage :
74
Lastpage :
75
Keywords :
CMOS technology; Capacitance; Circuits; Delay; Doping; Finite element methods; Inverters; Semiconductor device modeling; Semiconductor process modeling; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
ISSN :
1078-621X
Print_ISBN :
0-7803-7439-8
Type :
conf
DOI :
10.1109/SOI.1992.664801
Filename :
664801
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1949270
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