DocumentCode
1949278
Title
Die attach adhesives for 3D same-sized dies stacked packages
Author
Ch, T. ; Gaurav, Mehta ; Hong, Tan Hua ; Pl, O.W.
Author_Institution
United Test & Assembly Center (UTAC), Singapore
fYear
2008
fDate
27-30 May 2008
Firstpage
1538
Lastpage
1543
Abstract
The increasing demand for high performance integrated circuit devices has led to the development of multi-die stacking in a single package to improve functionality without increasing package form factor. Furthermore, there is tremendous pressure to decrease overall package height even with the additional dies stacking. Stacking same-sized dies directly on top of each other provides a unique challenge since there can be no clearance for the lower die bond wires. The solutions include (1) dummy silicon-as-spacer, (2) die attach paste-as-spacer and (3) die attach film-as spacer. Key requirements for the die attach (DA) paste or film is excellent adhesion to the passivation materials of adjacent dies. Also, a uniform bond-line thickness (BLT) is required for a large die application. In addition, high cohesive strength at high temperatures and low moisture absorption are preferred for good reliability. This paper focuses on the key DA materials challenges and resolution associated with the same-sized dies stacked packages qualification. The DA materials assessment includes both paste and film-based adhesive. Packages were built to understand how these DA adhesives would work in- package and study its reaction to the assembly process conditions.
Keywords
adhesives; elemental semiconductors; microassembling; silicon; 3D same-sized dies stacked packages; adhesives; assembly; die attach; dummy silicon-as-spacer; film-as spacer; paste-as-spacer; Absorption; Adhesives; Bonding; Integrated circuit packaging; Microassembly; Moisture; Passivation; Stacking; Temperature; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550180
Filename
4550180
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