• DocumentCode
    1949278
  • Title

    Die attach adhesives for 3D same-sized dies stacked packages

  • Author

    Ch, T. ; Gaurav, Mehta ; Hong, Tan Hua ; Pl, O.W.

  • Author_Institution
    United Test & Assembly Center (UTAC), Singapore
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1538
  • Lastpage
    1543
  • Abstract
    The increasing demand for high performance integrated circuit devices has led to the development of multi-die stacking in a single package to improve functionality without increasing package form factor. Furthermore, there is tremendous pressure to decrease overall package height even with the additional dies stacking. Stacking same-sized dies directly on top of each other provides a unique challenge since there can be no clearance for the lower die bond wires. The solutions include (1) dummy silicon-as-spacer, (2) die attach paste-as-spacer and (3) die attach film-as spacer. Key requirements for the die attach (DA) paste or film is excellent adhesion to the passivation materials of adjacent dies. Also, a uniform bond-line thickness (BLT) is required for a large die application. In addition, high cohesive strength at high temperatures and low moisture absorption are preferred for good reliability. This paper focuses on the key DA materials challenges and resolution associated with the same-sized dies stacked packages qualification. The DA materials assessment includes both paste and film-based adhesive. Packages were built to understand how these DA adhesives would work in- package and study its reaction to the assembly process conditions.
  • Keywords
    adhesives; elemental semiconductors; microassembling; silicon; 3D same-sized dies stacked packages; adhesives; assembly; die attach; dummy silicon-as-spacer; film-as spacer; paste-as-spacer; Absorption; Adhesives; Bonding; Integrated circuit packaging; Microassembly; Moisture; Passivation; Stacking; Temperature; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550180
  • Filename
    4550180