Title :
Ontology-driven visualization of architectural design decisions
Author :
De Boer, Remco C. ; Lago, Patricia ; Telea, Alexandru ; Van Vliet, Hans
Author_Institution :
Dept. of Comput. Sci., VU Amsterdam, Amsterdam, Netherlands
Abstract :
There is a gradual increase of interest to use ontologies to capture architectural knowledge, in particular architectural design decisions. While ontologies seem a viable approach to codification, the application of such codified knowledge to everyday practice may be non-trivial. In particular, browsing and searching an architectural knowledge repository for effective reuse can be cumbersome. In this paper, we present how ontology-driven visualization of architectural design decisions can be used to assist software product audits, in which independent auditors perform an assessment of a product´s quality. Our visualization combines the simplicity of tabular information representation with the power of on-the-fly ontological inference of decision attributes typically used by auditors. In this way, we are able to support the auditors in effectively reusing their know-how, and to actively assist the core aspects of their decision making process, namely trade-off analysis, impact analysis, and if-then scenarios. We demonstrate our visualization with examples from a real-world application.
Keywords :
auditing; data visualisation; decision making; ontologies (artificial intelligence); software architecture; architectural design decisions; architectural knowledge repository; decision making process; if-then scenarios; impact analysis; on-the-fly ontological inference; ontology-driven visualization; software product auditing; tabular information representation; trade-off analysis; Application software; Computer science; Data visualization; Decision making; Information representation; Mathematics; Ontologies; Software architecture; Software performance; Software quality;
Conference_Titel :
Software Architecture, 2009 & European Conference on Software Architecture. WICSA/ECSA 2009. Joint Working IEEE/IFIP Conference on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4244-4984-2
Electronic_ISBN :
978-1-4244-5295-8
DOI :
10.1109/WICSA.2009.5290791