Title :
A simple electrical model of acute and chronic injury (CTD) processes
Author :
LaCourse, John R. ; McCoy, Thom
Author_Institution :
Biomed. Eng. Center, New Hampshire Univ., Durham, NH, USA
Abstract :
A simple electrical analog model is used to understand the mechanisms of acute versus chronic disease processes, especially cumulative trauma disease. The model employs an RC circuit with inputs that allows typical exposure regimes
Keywords :
medicine; physiological models; RC circuit; acute injury processes; chronic injury processes; cumulative trauma disease; simple electrical analog model; typical exposure regimes; Biomedical engineering; Circuits; Costs; Diseases; Electric resistance; Human factors; Immune system; Injuries; Research and development; Voltage;
Conference_Titel :
Bioengineering Conference, 1994., Proceedings of the 1994 20th Annual Northeast
Conference_Location :
Springfield, MA
Print_ISBN :
0-7803-1930-3
DOI :
10.1109/NEBC.1994.305173
