Title :
Systematic design of dissipative and regenerative snubbers
Author :
Robinson, F.V.P. ; Williams, B.W.
Author_Institution :
PWM Drives Ltd., London, UK
Abstract :
Current commutation between diodes and switches is possible in hard-switching power stages over a wide di/dt range (10-1000+A/ mu s) with modern power devices and hardware practice. However, a definitive procedure does not exist for setting di/dt at diode reverse recovery. Diode turn-off performance is therefore examined, using IGBTs (insulated-gate bipolar transistors) to switch the diode current, to establish whether there exists an optimal di/dt that minimizes energy loss associated with diode recovery, when simple snubber-inductance reset circuits are used. Destructive parasitic oscillation, induced in inverse-parallel IGBTs across reverse-recovering freewheel diodes in IGBT modules, was observed during experimentation. The results indicate that snubberless power-stage operation, where active snubbing must be used to control switching transitions, is fundamentally less efficient than the best passive snubbing methods, that operation of diodes at very high di/dt is undesirable, and that very stiff power-switch drive circuits can lead to device failure in snubberless power stages.<>
Keywords :
bipolar transistors; commutation; insulated gate field effect transistors; overvoltage protection; semiconductor diodes; semiconductor switches; diode reverse recovery; diode turn-off; diodes; energy loss; freewheel diodes; hard-switching power stages; insulated-gate bipolar transistors; power devices; power-switch drive circuits; regenerative snubbers; snubber-inductance reset circuits; switches; Clamps; Damping; Diodes; Electromagnetic coupling; Energy exchange; Insulated gate bipolar transistors; Snubbers; Switches; Switching circuits; Voltage control;
Conference_Titel :
Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IAS.1989.96814