• DocumentCode
    1949566
  • Title

    Advanced viscoelastic material model for predicting warpage of a QFN panel

  • Author

    de Vreugd, J. ; Jansen, K.M.B. ; Xiao, A. ; Ernst, L.J. ; Bohm, C. ; Kessler, A. ; Preu, H. ; Stecher, M.

  • Author_Institution
    Delft Univ. of Technol., Delft
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1635
  • Lastpage
    1640
  • Abstract
    Warpage is a critical issue for a QFN panel molding process. Much work is done in the past to predict the warpage of a package during cooling down from molding temperature. However, until now, warpage could not always be predicted well, even if the viscoelastic behavior of the molding compound is taken into account. It was for example observed that the cooling velocity affected the warpage after cooling down. Because of this reason, the mechanical behavior of the molding compound was investigated in more detail. In this research, the mechanical properties of the molding compound are determined. It turned out that the properties are highly dependent on time and temperature. A complete viscoelastic model of the model compound is achieved by combining DMA and dilatometric test results. The model is implemented in the finite element software ABAQUS. In this study, our advanced model is compared with elastic calculations which are normally done. A validation experiment is performed in which simulation results are compared with experimental warpage data of a double layered beam, consisting out of a layer of molding compound and a layer of silicon. This beam is cooled down from a temperature above Tg to room temperature with different cooling rates. In the meantime warpage is measured and compared to simulation results. Finally, the advanced material model is used for calculations on a QFN-panel.
  • Keywords
    electronics packaging; extensometers; finite element analysis; moulding; viscoelasticity; QFN panel molding process; dilatometric test; double layered beam; finite element software ABAQUS; mechanical properties; molding compound; viscoelastic material model; warpage prediction; Cooling; Elasticity; Finite element methods; Mechanical factors; Packaging; Predictive models; Silicon; Temperature dependence; Testing; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550196
  • Filename
    4550196