Title :
Development of high frequency SPICE models for ferrite core inductors and transformers
Author :
Muyshondt, G. Patrick ; Portnoy, William M.
Author_Institution :
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
Abstract :
High-frequency SPICE models were developed to simulate the hysteresis and saturation effects of toroidal-ferrite-core inductors and transformers. The models include the nonlinear, multivalued B-H characteristic of the core material, leakage flux, stray capacitances, and core losses. The saturation effects were modeled using two-diode clamping arrangements in conjunction with nonlinear sources. Two possible controlling schemes were developed for the saturation switch. One of the arrangements used the current flowing through a series RC branch to control the switch, and the other used a NAND gate. The NAND-gate implementation of the switch proved to be simpler, and the parameters associated with it were easier to determine from the measurements and the B-H characteristics of the material. Lumped parameters were used to simulate the parasitic effects. Techniques for measuring these parasitics are described. The models were verified using manganese-zinc-ferrite-type toroidal cores, and they have general applicability to all circuit analysis codes provided that they contain nonlinear sources or equivalent function blocks such as multipliers, adders, and logic components.<>
Keywords :
digital simulation; electrical engineering computing; ferrite devices; inductors; magnetic cores; magnetic flux; magnetic hysteresis; magnetic leakage; transformers; B-H characteristic; Mn/sub 1-x/Zn/sub x/Fe/sub 2/O/sub 4/; NAND gate; core losses; ferrite core inductors; high frequency SPICE models; hysteresis; leakage flux; lumped parameters; saturation effects; stray capacitances; toroidal-ferrite-core; transformers; two-diode clamping; Capacitance; Clamps; Core loss; Ferrites; Frequency; Hysteresis; Inductors; SPICE; Switches; Transformer cores;
Conference_Titel :
Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IAS.1989.96815