• DocumentCode
    1949697
  • Title

    Trends and challenges of large scale embedded memories

  • Author

    Furuyama, Toshiya

  • Author_Institution
    SoC Res. & Dev. Center, Toshiba Corp., Semicond. Co., Kawasaki, Japan
  • fYear
    2004
  • fDate
    3-6 Oct. 2004
  • Firstpage
    449
  • Lastpage
    456
  • Abstract
    Embedded memories are increasingly becoming more important components for SoCs (system on a chip) as the silicon technology advances and SoCs get more complex. In addition, diverging SoC applications require wide range of different performance and specification for embedded memories; from very high bandwidth to ultra low power consumption. This paper overviews the trend in large scale (capacity) embedded memories and some of the challenges to meet the wide spread requirements.
  • Keywords
    DRAM chips; SRAM chips; embedded systems; integrated circuit design; integrated circuit technology; low-power electronics; reviews; system-on-chip; DRAM; SRAM; SoC; large scale embedded memories; memory performance; memory specification; silicon technology; system on a chip; ultra low power consumption; very high bandwidth; Bandwidth; Energy consumption; Large-scale systems; Leakage current; MOSFET circuits; Random access memory; Silicon; System-on-a-chip; Transistors; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
  • Print_ISBN
    0-7803-8495-4
  • Type

    conf

  • DOI
    10.1109/CICC.2004.1358849
  • Filename
    1358849