DocumentCode :
1949697
Title :
Trends and challenges of large scale embedded memories
Author :
Furuyama, Toshiya
Author_Institution :
SoC Res. & Dev. Center, Toshiba Corp., Semicond. Co., Kawasaki, Japan
fYear :
2004
fDate :
3-6 Oct. 2004
Firstpage :
449
Lastpage :
456
Abstract :
Embedded memories are increasingly becoming more important components for SoCs (system on a chip) as the silicon technology advances and SoCs get more complex. In addition, diverging SoC applications require wide range of different performance and specification for embedded memories; from very high bandwidth to ultra low power consumption. This paper overviews the trend in large scale (capacity) embedded memories and some of the challenges to meet the wide spread requirements.
Keywords :
DRAM chips; SRAM chips; embedded systems; integrated circuit design; integrated circuit technology; low-power electronics; reviews; system-on-chip; DRAM; SRAM; SoC; large scale embedded memories; memory performance; memory specification; silicon technology; system on a chip; ultra low power consumption; very high bandwidth; Bandwidth; Energy consumption; Large-scale systems; Leakage current; MOSFET circuits; Random access memory; Silicon; System-on-a-chip; Transistors; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN :
0-7803-8495-4
Type :
conf
DOI :
10.1109/CICC.2004.1358849
Filename :
1358849
Link To Document :
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