Title :
A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
Author :
Yafouz, B. ; Kadri, N.A. ; Ibrahim, Fatimah
Author_Institution :
Dept. of Biomed. Eng., Univ. of Malaya, Kuala Lumpur, Malaysia
Abstract :
Dielectrophoresis (DEP) has been proven as a method of manipulating and analyzing the electrophysiological properties of bioparticles by applying non-uniform electric fields generated through special electrodes. Various electrode geometries have been developed to address different applications. Simulation of the electric field strength over electrodes is essential in order to optimize the generated DEP force for enhancing cell manipulation. This paper describes the study of electric field distribution over planar multiple microarray dot electrode using numerical modeling of Comsol Multiphysics 4.2a®. Results show that the electric field strength is axisymmetrical around the centre of the dot aperture and that is higher at the dot edges than the dot centers. Further studies will be conducted to investigate the effect of applying different frequencies, varying dots size and adding ground plane in between the electrode dots.
Keywords :
bioMEMS; bioelectric phenomena; biological techniques; cellular biophysics; electrochemical electrodes; electrophoresis; lab-on-a-chip; numerical analysis; Comsol Multiphysics 4.2a; DEP force generation; bioparticles; cell manipulation enhancement; dielectrophoretic lab-on-chip device; dot centre aperture; dot edges; electric field distribution; electric field strength simulation; electrode dots; electrode geometries; electrophysiological properties; ground plane; nonuniform electric fields; numerical analysis; planar microarray dot electrode; planar multiple microarray dot electrode; special electrodes; Lab-on-Chip; dielectrophoresis; dot microarray electrodes; numerical modeling;
Conference_Titel :
Biomedical Engineering and Sciences (IECBES), 2012 IEEE EMBS Conference on
Conference_Location :
Langkawi
Print_ISBN :
978-1-4673-1664-4
DOI :
10.1109/IECBES.2012.6498060