Title :
A robust, modular, IGBT power supply for configurable series/parallel operation at high power and frequency
Author :
Ziemba, T. ; Miller, K. ; Prager, J. ; Carscadden, J.
Author_Institution :
Eagle Harbor Technol., Inc., Seattle, WA, USA
Abstract :
There is considerable interest in solid state power supplies based on Insulated Gate Bi-polar Transistor (IGBT) technologies due to their large and efficient power handling capabilities. Historically, IGBTs have been limited in switching frequency, difficult to arrange in series configurations for high voltage applications, and readily damaged if not properly controlled. There are a large number of applications that would greatly benefit from a highly configurable, high current, high voltage, modular IGBT based solid state power supply. For example, pulsed Radio Frequency (RF) amplifiers in the several MW class operating at 50 kHz to 5 MHz used for current drive, plasma heating, and ionization within the fusion science community could see significant cost savings when compared to traditional tube based supplies. Other applications that would immediately benefit from a low cost IGBT option include active magnetic coil control for feedback, inductive plasma generation, fast rise-time high voltage triggers, and controllable high current switches.
Keywords :
coils; insulated gate bipolar transistors; ionisation; plasma applications; plasma heating; power supplies to apparatus; radiofrequency amplifiers; IGBT power supply; active magnetic coil control; configurable series-parallel operation; controllable high current switches; frequency 50 kHz to 5 MHz; fusion science community; high voltage applications; inductive plasma generation; insulated gate bipolar transistor-based solid state power supplies; ionization; modular IGBT-based solid state power supply; plasma heating; power handling capabilities; pulsed radio frequency amplifiers; rise-time high voltage triggers; switching frequency; tube-based supplies; Coaxial cables; Insulated gate bipolar transistors; Radio frequency; Robustness; Switches; Testing;
Conference_Titel :
Pulsed Power Conference (PPC), 2011 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4577-0629-5
DOI :
10.1109/PPC.2011.6191607