DocumentCode :
1950181
Title :
3D Numerical Simulation for Assisting External Latch-up Protection Test Structure Design
Author :
Palser, K. ; Concannon, A. ; Duffy, R. ; Mathewson, A.
Author_Institution :
National Microelectronics Research Centre, Cork, Ireland
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
508
Lastpage :
511
Keywords :
Electrostatic discharge; Guidelines; Isolation technology; Leakage current; Materials reliability; Microelectronics; Numerical simulation; Pattern analysis; Protection; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505551
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1950181
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