• DocumentCode
    1950181
  • Title

    3D Numerical Simulation for Assisting External Latch-up Protection Test Structure Design

  • Author

    Palser, K. ; Concannon, A. ; Duffy, R. ; Mathewson, A.

  • Author_Institution
    National Microelectronics Research Centre, Cork, Ireland
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    508
  • Lastpage
    511
  • Keywords
    Electrostatic discharge; Guidelines; Isolation technology; Leakage current; Materials reliability; Microelectronics; Numerical simulation; Pattern analysis; Protection; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505551
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1950181