DocumentCode
1950245
Title
Efficient sampling of reference noise in a switched capacitor ΣΔ ADC
Author
O´Connell, Ivan John ; Lyden, Colin
Author_Institution
Dept. of Microelectron., Nat. Univ. of Ireland, Cork, Ireland
fYear
2004
fDate
3-6 Oct. 2004
Firstpage
531
Lastpage
534
Abstract
The implementation of an efficient sampling technique whereby the reference capacitor is selectively sampled within a switched capacitor ΣΔ ADC is presented, resulting in improved thermal noise performance. When a transition occurs in the modulator feedback, the reference capacitors are not sampled but instead discharged to ground. The introduction of a do-not-sample state requires that the ΣΔ modulator is compensated. For mid-scale inputs, the overall ADC noise is reduced by 5.6 dB, without any increase in power consumption.
Keywords
circuit feedback; compensation; digital-analogue conversion; integrating circuits; sigma-delta modulation; signal sampling; switched capacitor networks; thermal noise; do-not-sample state; ground discharged reference capacitors; modulator compensation; modulator feedback transitions; reference DAC; reference noise sampling; sampled reference capacitor; switched capacitor bilinear integrators; switched capacitor sigma-delta ADC; thermal noise; Batteries; Capacitors; Chromium; Energy consumption; Feedback; Microelectronics; Noise reduction; Sampling methods; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN
0-7803-8495-4
Type
conf
DOI
10.1109/CICC.2004.1358876
Filename
1358876
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