• DocumentCode
    1950463
  • Title

    Limitations to Adaptive Back Bias Approach for Standby Power Reduction in deep sub-micron CMOS

  • Author

    Montree, A.H. ; van Brandenburg, A.C.M.C. ; Klaassen, D.B.M. ; LLopis, R. Peset ; Ponomarev, Y.V. ; Roes, R.F.M. ; Scholten, A.J. ; van Veen, R.S.

  • Author_Institution
    Philips Research Laboratories, Eindhoven, The Netherlands
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    580
  • Lastpage
    583
  • Keywords
    Boron; CMOS logic circuits; CMOS technology; Circuit testing; Current measurement; Implants; Leakage current; Logic testing; MOS devices; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505569
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1950463