A New Lifetime Extrapolation Technique for LDD NMOSFETs under Hot-Carrier Degradation

Author

Dreesen, R. ; Croes, K. ; Manca, J. ; Ceuninck, W. De ; Schepper, L. De ; Pergoot, A. ; Groeseneken, G.

Author_Institution

Limburgs University Centre, Diepenbeek, Belgium

Volume

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

584

Lastpage

587

Keywords

Aging; Analytical models; CMOS process; Degradation; Extrapolation; Hot carriers; Interface states; MOSFETs; Measurement techniques; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

Filename

1505570

Link To Document