DocumentCode

1950585

Title

Effect of Total Dose Radiation on Device Self Latch-Up

Author

Brady, F.T. ; Haddad, N.F. ; Wang, L.K.

Author_Institution

IBM Federal Systems Company, Manassas, VA

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

88

Lastpage

89

Keywords

Circuits; Degradation; Feeds; Impact ionization; Near-field radiation pattern; Power supplies; Radiative recombination; Semiconductor films; Substrates; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664808

Filename

664808