Title :
Trade-Off Between Programming Speed and Current Absorption in Flash EEPROM Memories
Author :
Esseni, David ; Giannasi, Fabrizio ; Riccò, Bruno ; Villa, Corrado
Author_Institution :
University of Bologna, Italy
Keywords :
Absorption; Bandwidth; EPROM; Functional programming; Intrusion detection; Parallel programming; Random access memory; Read only memory; Testing; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
