DocumentCode

1950627

Title

Trade-Off Between Programming Speed and Current Absorption in Flash EEPROM Memories

Author

Esseni, David ; Giannasi, Fabrizio ; Riccò, Bruno ; Villa, Corrado

Author_Institution

University of Bologna, Italy

Volume

1

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

612

Lastpage

615

Keywords

Absorption; Bandwidth; EPROM; Functional programming; Intrusion detection; Parallel programming; Random access memory; Read only memory; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

conf

Filename

1505577