DocumentCode

1950934

Title

Introduction to silicon debug and SoC test - Session 30

fYear

2004

fDate

3-6 Oct. 2004

Firstpage

663

Lastpage

663

Keywords

Circuit testing; Geometry; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004

Print_ISBN

0-7803-8495-4

Type

conf

DOI

10.1109/CICC.2004.1358913

Filename

1358913