• DocumentCode
    1950942
  • Title

    The quantitative effect of anode plasma on a pinched electron beam from particle in cell modelling of a self magnetic pinch diode

  • Author

    Martin, P.N. ; Threadgold, J.R. ; Welch, D.

  • Author_Institution
    Atomic Weapons Establ., Reading, UK
  • fYear
    2011
  • fDate
    19-23 June 2011
  • Firstpage
    1453
  • Lastpage
    1458
  • Abstract
    The effect of a proton or carbon anode plasma on the pinched electron beam present in a self magnetic pinch (SMP) diode has been investigated using the Large Scale Plasma (LSP*) code. The resultant plasma generated by the fragmentation of desorbed material is described together with the simulation parameters used. The probability distributions of radial charge, macro particle energy and macro particle velocity of the electron beam are described as a function of emission region and position across the A-K gap. The conclusions of this investigation are that the presence of the anode plasmas change both the impedance of the diode as well as the quantitative evolution of the electron beam. The energy and average electron angle of the electron beam are presented and the interaction with the plasma-front discussed.
  • Keywords
    desorption; pinch effect; plasma collision processes; plasma diodes; plasma simulation; plasma transport processes; probability; A-K gap; average electron angle; carbon anode plasma; desorbed material; electron beam energy; emission region; large scale plasma code; macro particle energy distribution; macro particle velocity distribution; particle in cell modelling; pinched electron beam; probability distribution; proton anode plasma; radial charge distribution; self magnetic pinch diode; simulation parameters; Anodes; Atomic beams; Atomic measurements; Cathodes; Plasmas; Probes; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference (PPC), 2011 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    2158-4915
  • Print_ISBN
    978-1-4577-0629-5
  • Type

    conf

  • DOI
    10.1109/PPC.2011.6191662
  • Filename
    6191662