Title :
The crazy mixed up world of silicon debug [IC validation]
Author :
Josephson, Doug ; Gottlieb, Bob
Author_Institution :
Hewlett-Packard Co., USA
Abstract :
In this paper, we give an overview of the silicon debug process. We discuss the procedure of debug, along with the current state of the art tools and design features used to assist in the process of doing debug. In conclusion, we discuss what new challenges lay ahead in the area of silicon debug.
Keywords :
integrated circuit design; integrated circuit testing; Si; debug design features; debug tools; electrical validation; functional validation plan; silicon debug process; Chip scale packaging; Computer bugs; Delay; Design engineering; Fabrication; Frequency; Manufacturing; Production; Silicon; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004
Print_ISBN :
0-7803-8495-4
DOI :
10.1109/CICC.2004.1358915
