مرکز منطقه ای اطلاع رساني علوم و فناوري - Proceedings of IEEE International Electron Devices Meeting [Front Cover]

Keywords :

detectors; display devices; image sensors; integrated circuit technology; micromechanical devices; microwave tubes; monolithic integrated circuits; optoelectronic devices; power electronics; semiconductor devices; semiconductor lasers; semiconductor storage; semiconductor technology; vacuum microelectronics; BiCMOS devices; BiCMOS technologies; CMOS device reliability; CMOS technology; DRAM technology; SOI technology; SRAM technology; TFTs; bipolar devices; compound semiconductor FETs; displays; etching; gate dielectrics; gyroamplifiers; gyrooscillators; heterojunction bipolar transistors; high energy transport; hot carrier effects; infrared image sensors; interconnect technology; lithography; micromachined devices; nonvolatile memories; optoelectronic devices; physical device models; power IC; power devices; quantum effect electronic devices; semiconductor lasers; semiconductor process modelling; sensors; slow wave devices; vacuum microelectronics; visible image sensors;