• DocumentCode
    1951343
  • Title

    Infrared imaging of defects in materials with chaotic Sonic excitation

  • Author

    Thomas, R.L. ; Han, Xiaoyan ; Favro, L.D. ; Newaz, Golam

  • Author_Institution
    Wayne State Univ., Detroit, MI, USA
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    591
  • Lastpage
    594
  • Abstract
    Infrared imaging of defects in materials has become a standard tool in nondestructive evaluation (NDE). The most recent version of this technology uses ultrasound to excite the defects by friction or other dissipative effects. This version is greatly enhanced by the use of "chaotic" sound.
  • Keywords
    flaw detection; infrared imaging; ultrasonic materials testing; chaotic sonic excitation; infrared defect imaging; nondestructive evaluation; ultrasound excitation; Acoustics; Chaos; Heating; Imaging; Materials; Resonant frequency; Transducers; chaos; defects; infrared; nondestructive; ultrasonic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935448
  • Filename
    5935448
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1951343