Title :
Infrared imaging of defects in materials with chaotic Sonic excitation
Author :
Thomas, R.L. ; Han, Xiaoyan ; Favro, L.D. ; Newaz, Golam
Author_Institution :
Wayne State Univ., Detroit, MI, USA
Abstract :
Infrared imaging of defects in materials has become a standard tool in nondestructive evaluation (NDE). The most recent version of this technology uses ultrasound to excite the defects by friction or other dissipative effects. This version is greatly enhanced by the use of "chaotic" sound.
Keywords :
flaw detection; infrared imaging; ultrasonic materials testing; chaotic sonic excitation; infrared defect imaging; nondestructive evaluation; ultrasound excitation; Acoustics; Chaos; Heating; Imaging; Materials; Resonant frequency; Transducers; chaos; defects; infrared; nondestructive; ultrasonic;
Conference_Titel :
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0382-9
DOI :
10.1109/ULTSYM.2010.5935448
