• DocumentCode
    1951760
  • Title

    Investigation of the thermal performance of micro-whisker structured silicon heatspreaders for power devices

  • Author

    Nicolics, J. ; Hanreich, G. ; Stangl, G.

  • Author_Institution
    Inst. of Mater. Sci. for Electr. Eng., Tech. Univ. Wien, Austria
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    671
  • Abstract
    Driving forces for developments in power electronics are the continuing miniaturization and enhancement of power densities. New packaging concepts are required allowing to dissipate loss power density levels of several hundred W/cm2 at operation temperatures as low as possible. A promising attempt to decrease the thermal resistance to the ambient is the development of silicon substrates structured with microwhiskers perpendicular to its surface. An industrial application of this new heatspreader technology in power electronic modules makes necessary the specification of the substrate properties. In this work a new method for determination of thermal qualities based on laser heating of the heatspreader, surface temperature measurement by thermovision, and dynamic reverse modeling is described. For numerical determination of the thermal characteristics the measured data are evaluated with the help of a thermal model of the heatspreaders under various boundary conditions. The respective temperature distributions are calculated with a new simulation tool using an alternating direction implicit algorithm (ADI-method). Results obtained from heatspreaders with microwhisker treatment are compared with those from reference samples with a polished surface. Based on these results a view on future applications for power electronics assemblies are derived
  • Keywords
    elemental semiconductors; heat sinks; power semiconductor devices; silicon; thermal resistance; whiskers (crystal); Si; alternating direction implicit algorithm; dynamic reverse model; laser heating; micro-whisker heatspreader; numerical simulation; packaging; power device; silicon substrate; surface temperature measurement; temperature distribution; thermal resistance; thermovision; Electronic packaging thermal management; Electronics industry; Heating; Laser modes; Power electronics; Silicon; Surface emitting lasers; Surface resistance; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-5235-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2000.838779
  • Filename
    838779