DocumentCode
1951790
Title
Molecularly derived mesoscale modeling of an epoxy/Cu interface (part III*): Interface roughness
Author
Iwamoto, Nancy
Author_Institution
Honeywell Specialty Mater., USA
fYear
2012
fDate
16-18 April 2012
Firstpage
42377
Lastpage
42590
Abstract
This paper addresses use of coarse-grained mesoscale model to look at angle dependencies in an epoxy-copper (I) oxide interface in order to understand roughness effects on adhesion. The parameterization of the coarse-grained beads were previously parameterized from the molecular level [1-3] for the same polymer and copper oxide interface. Roughness was investigated in two ways: applying a zigzag interface to the interface separation simulation, and separating the interface using differing angles. When compared, both methods reduce to the similar energy trends. In addition, the effect moisture on the interface was compared for the rough and smooth interfaces.
Keywords
adhesion; copper compounds; molecular dynamics method; polymers; resins; surface roughness; CuO; adhesion; coarse-grained beads; coarse-grained mesoscale model; epoxy-copper oxide interface; interface roughness; interface separation simulation; molecularly derived mesoscale modeling; polymer; zigzag interface; Delamination; Polymers; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location
Cascais
Print_ISBN
978-1-4673-1512-8
Type
conf
DOI
10.1109/ESimE.2012.6191702
Filename
6191702
Link To Document