• DocumentCode
    1951790
  • Title

    Molecularly derived mesoscale modeling of an epoxy/Cu interface (part III*): Interface roughness

  • Author

    Iwamoto, Nancy

  • Author_Institution
    Honeywell Specialty Mater., USA
  • fYear
    2012
  • fDate
    16-18 April 2012
  • Firstpage
    42377
  • Lastpage
    42590
  • Abstract
    This paper addresses use of coarse-grained mesoscale model to look at angle dependencies in an epoxy-copper (I) oxide interface in order to understand roughness effects on adhesion. The parameterization of the coarse-grained beads were previously parameterized from the molecular level [1-3] for the same polymer and copper oxide interface. Roughness was investigated in two ways: applying a zigzag interface to the interface separation simulation, and separating the interface using differing angles. When compared, both methods reduce to the similar energy trends. In addition, the effect moisture on the interface was compared for the rough and smooth interfaces.
  • Keywords
    adhesion; copper compounds; molecular dynamics method; polymers; resins; surface roughness; CuO; adhesion; coarse-grained beads; coarse-grained mesoscale model; epoxy-copper oxide interface; interface roughness; interface separation simulation; molecularly derived mesoscale modeling; polymer; zigzag interface; Delamination; Polymers; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
  • Conference_Location
    Cascais
  • Print_ISBN
    978-1-4673-1512-8
  • Type

    conf

  • DOI
    10.1109/ESimE.2012.6191702
  • Filename
    6191702