Title :
A system for measuring surface facet orientation from atomic force microscope data
Author :
Hagedorn, John ; Rushmeier, Holly ; Blendell, John ; Vaudin, Mark
Author_Institution :
Comput. & Appl. Math. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
Oct. 27 1996-Nov. 1 1996
Abstract :
The authors describe a graphical system developed for researchers in materials science for extracting information from data obtained by atomic force microscopy. In particular, they consider the problem of computing surface orientations from data obtained from ceramic materials. The visualization problems they consider in designing this system include finding useful mechanisms for the researcher to interact with the data, presenting results in forms familiar to the scientist, and enhancing traditional display techniques.
Keywords :
microscopy; atomic force microscope data; ceramic materials; data interaction; display techniques; graphical system; information extraction; materials science; results presentation; surface facet orientation measurement; surface orientation computation; Atomic force microscopy; Atomic measurements; Data mining; Data visualization; Force measurement; Laboratories; Materials science and technology; Probes; Shape; Surface morphology;
Conference_Titel :
Visualization '96. Proceedings.
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-864-9
DOI :
10.1109/VISUAL.1996.568141