DocumentCode :
1951806
Title :
A system for measuring surface facet orientation from atomic force microscope data
Author :
Hagedorn, John ; Rushmeier, Holly ; Blendell, John ; Vaudin, Mark
Author_Institution :
Comput. & Appl. Math. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
1996
fDate :
Oct. 27 1996-Nov. 1 1996
Firstpage :
397
Lastpage :
400
Abstract :
The authors describe a graphical system developed for researchers in materials science for extracting information from data obtained by atomic force microscopy. In particular, they consider the problem of computing surface orientations from data obtained from ceramic materials. The visualization problems they consider in designing this system include finding useful mechanisms for the researcher to interact with the data, presenting results in forms familiar to the scientist, and enhancing traditional display techniques.
Keywords :
microscopy; atomic force microscope data; ceramic materials; data interaction; display techniques; graphical system; information extraction; materials science; results presentation; surface facet orientation measurement; surface orientation computation; Atomic force microscopy; Atomic measurements; Data mining; Data visualization; Force measurement; Laboratories; Materials science and technology; Probes; Shape; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Visualization '96. Proceedings.
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-864-9
Type :
conf
DOI :
10.1109/VISUAL.1996.568141
Filename :
568141
Link To Document :
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