Title :
A new 600V PT-IGBT for the improved avalanche energy by employing the floating p-well
Author :
Kim, Soo-Seong ; Yun, Chong-Man ; Choi, Yeam-Ik ; Han, Min-Koo
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
A new IGBT employing a floating p-well, which improves the avalanche energy, is proposed and verified using the 2D numerical simulation. By implementing the floating p-well, the peak point of impact ionization moves from the surface under the gate to the bottom of the p-well so that the hole current flows vertically through the bottom of the p-well under the unclamped inductive switching (UIS). Hence, the avalanche capability can be significantly improved by the reduction of the hole current beneath the n+ emitter. Also, the saturation voltage of the proposed device can be comparable to that of the conventional device by adjusting the thickness of the n-epitaxial layer.
Keywords :
avalanche breakdown; circuit optimisation; impact ionisation; insulated gate bipolar transistors; semiconductor device manufacture; semiconductor quantum wells; 2D numerical simulation; 600 V; PT-IGBT; UIS; avalanche capability; avalanche energy; floating p-well; hole current; impact ionization; n+ emitter; n-epitaxial layer; peak point; punch through insulated gate bipolar transistor; saturation voltage; unclamped inductive switching; Circuits; Electric breakdown; Epitaxial layers; Frequency; Immune system; Impact ionization; Insulated gate bipolar transistors; Switched-mode power supply; Switches; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on
Print_ISBN :
0-7803-7876-8
DOI :
10.1109/ISPSD.2003.1225233