DocumentCode :
1952140
Title :
Transport of moisture at epoxy-SiO2 interfaces investigated by molecular modeling
Author :
Hölck, O. ; Bauer, J. ; Braun, T. ; Walter, H. ; Wittler, O. ; Wunderle, B.
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration (IZM), Berlin, Germany
fYear :
2012
fDate :
16-18 April 2012
Firstpage :
42375
Lastpage :
42527
Abstract :
An analysis of moisture transport through the bulk of a crosslinked epoxy has been performed experimentally and by molecular dynamics simulations. It was shown that results of the diffusion coefficient compare well for the investigated system and an analysis of the activation energy gives reasonable agreement between experiment and simulation.
Keywords :
moisture; molecular dynamics method; resins; SiO2; crosslinked epoxy; diffusion coefficient; epoxy-SiO2 interfaces; moisture transport; molecular dynamics simulations; molecular modeling; Materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location :
Cascais
Print_ISBN :
978-1-4673-1512-8
Type :
conf
DOI :
10.1109/ESimE.2012.6191718
Filename :
6191718
Link To Document :
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