DocumentCode
1952200
Title
Comparing two life cycle assessment approaches: a process model vs. economic input-output-based assessment
Author
Hendrickson, Chris T. ; Horvath, Arpad ; Joshi, Satish ; Klausner, Marhs ; Lave, Lester B. ; McMichael, Francis C.
Author_Institution
Green Design Initiative, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1997
fDate
5-7 May 1997
Firstpage
176
Lastpage
181
Abstract
We compare two tools for Life Cycle Assessment (LCA). The software GaBi (Ganzheitliche Bilanzierung Integrated Assessment) from Germany is based on a process model approach, as recommended by the Society of Environmental Toxicology and Chemistry (SETAC). These results are contrasted to those from the method developed by Carnegie Mellon University´s Green Design Initiative, Economic Input-Output Life Cycle Analysis (EIO-LCA). The EIO-LCA model uses economic input-output matrices, and industry sector level environmental and nonrenewable resource consumption data to assesses the economy-wide environmental impacts of products and processes. The results from the alternative approaches are compared in terms of toxic chemical releases, conventional pollutant emissions, energy use by fuel type, and use of ores. We find that most of the values from the two tools are within the same order of magnitude, despite the fundamental differences in the models. We contrast the two approaches to identify their relative strengths and weaknesses
Keywords
economics; environmental factors; GaBi software; SETAC; economic input-output matrix; energy use; environmental impact; life cycle assessment; nonrenewable resource consumption; ore use; pollutant emission; process model; toxic chemical release; Chemistry; Environmental economics; Environmentally friendly manufacturing techniques; Fuel economy; Fuel processing industries; Industrial economics; Industrial pollution; Power generation economics; Toxic chemicals; Toxicology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and the Environment, 1997. ISEE-1997., Proceedings of the 1997 IEEE International Symposium on
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-3808-1
Type
conf
DOI
10.1109/ISEE.1997.605313
Filename
605313
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