DocumentCode :
1952248
Title :
Prospects of high voltage power ICs on thin SOI
Author :
Nakagawa, A. ; Yasuhara, N. ; Omura, I. ; Yamaguchi, Y. ; Ogura, T. ; Matsudai, T.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
fYear :
1992
fDate :
13-16 Dec. 1992
Firstpage :
229
Lastpage :
232
Abstract :
Silicon on Insulator technology is promising for high voltage power IC applications. The required SOI layer thickness can be reduced if a large portion of the applied voltage is sustained by the bottom insulator layer. Combination of SOI and trenches or LOCOS has merits of simplified device isolation and high device packing density. Thin SOI layer will realize high-speed switching in high voltage devices because of the smaller amount of stored carriers. Substrate bias influences on device characteristics and potentials of SOI technology are discussed.<>
Keywords :
integrated circuit technology; large scale integration; power integrated circuits; semiconductor-insulator boundaries; LOCOS; SOI layer thickness; device isolation; device packing density; high voltage power ICs; high-speed switching; silicon on insulator technology; stored carriers; substrate bias influences; thin SOI; trenches; Integrated circuit fabrication; Large-scale integration; Power integrated circuits; Semiconductor-insulator interfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0817-4
Type :
conf
DOI :
10.1109/IEDM.1992.307348
Filename :
307348
Link To Document :
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