• DocumentCode
    1952281
  • Title

    A debugging method for repairing post-silicon bugs of high performance processors in the fields

  • Author

    Alizadeh, Bijan ; Fujita, Masahiro

  • Author_Institution
    VLSI Design & Educ. Center (VDEC), Univ. of Tokyo, Tokyo, Japan
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    328
  • Lastpage
    331
  • Abstract
    Due to the highly complicated control structures of modern processors, some of the logical bugs may escape from the verification process and remain into the silicon. This paper proposes verification/debugging/field-rectification methods based on formal verification techniques that enables designers not only to automatically debug high performance processors by concentrating on word-level reasoning but also to introduce key control points with programmability in the silicon so that post-silicon bugs can be rectified in the field. The results show that by considering those state variables that fix wide ranges of pre-silicon bugs as key control points for programmability in the fields, inserted LUTs can be reduced due to the fact that only one LUT can be shared to correct all relevant bugs.
  • Keywords
    computer debugging; elemental semiconductors; formal verification; integrated circuit design; microprocessor chips; silicon; table lookup; LUT; Si; debugging method; field-rectification methods; formal verification techniques; high performance processors; key control points; post-silicon bug; verification process; word-level reasoning; Computer bugs; Debugging; Program processors; Registers; Silicon; Table lookup; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field-Programmable Technology (FPT), 2010 International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8980-0
  • Type

    conf

  • DOI
    10.1109/FPT.2010.5681434
  • Filename
    5681434