• DocumentCode
    1952287
  • Title

    Deformation sensitive cuts of quartz for torque sensor

  • Author

    Shvetsov, A. ; Zhgoon, S. ; Lonsdale, A. ; Sandacci, S.

  • Author_Institution
    Dept. of Radio Eng. Fundamentals, Moscow Power Eng. Inst., Moscow, Russia
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    1250
  • Lastpage
    1253
  • Abstract
    Single crystal quartz is a common substrate used in sensors for measurement of pressure, stress and torque. We report on the calculation of the torque sensitivity of SAW resonators arranged on all possible orientations of quartz substrate. The calculation is based on third order material constants and it has predicted useful orientations combining good sensitivity (3-3.5 times better than that of the ST-quartz) with practical wave propagation properties. The wafers with selected cuts of quartz have been fabricated; four resonator layouts were designed in order to work with arbitrary phase of reflection coefficient from electrodes. Resonators were tested and measurements prove the validity of the calculations. An important feature of torque sensors is the temperature dependence of the torque sensitivity that cannot be predicted in calculations with third order constants and that may be prohibitively large. This feature has been measured and relatively weak temperature dependence has been found for some cuts, notably for Y+27° cut with the propagation direction of 50° to the X axis.
  • Keywords
    pressure measurement; quartz; stress measurement; surface acoustic wave resonators; surface acoustic wave sensors; torque measurement; SAW resonators; crystal quartz; pressure measurement; quartz substrate; reflection coefficient; resonator layouts; stress measurement; temperature dependence; torque measurement; torque sensitivity; torque sensors; wave propagation; Reflection; Sensitivity; Shafts; Surface acoustic waves; Temperature measurement; Temperature sensors; Torque; SAW; quartz; resonator; sensor; temperature dependence; torque; torque sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935489
  • Filename
    5935489