DocumentCode
1952287
Title
Deformation sensitive cuts of quartz for torque sensor
Author
Shvetsov, A. ; Zhgoon, S. ; Lonsdale, A. ; Sandacci, S.
Author_Institution
Dept. of Radio Eng. Fundamentals, Moscow Power Eng. Inst., Moscow, Russia
fYear
2010
fDate
11-14 Oct. 2010
Firstpage
1250
Lastpage
1253
Abstract
Single crystal quartz is a common substrate used in sensors for measurement of pressure, stress and torque. We report on the calculation of the torque sensitivity of SAW resonators arranged on all possible orientations of quartz substrate. The calculation is based on third order material constants and it has predicted useful orientations combining good sensitivity (3-3.5 times better than that of the ST-quartz) with practical wave propagation properties. The wafers with selected cuts of quartz have been fabricated; four resonator layouts were designed in order to work with arbitrary phase of reflection coefficient from electrodes. Resonators were tested and measurements prove the validity of the calculations. An important feature of torque sensors is the temperature dependence of the torque sensitivity that cannot be predicted in calculations with third order constants and that may be prohibitively large. This feature has been measured and relatively weak temperature dependence has been found for some cuts, notably for Y+27° cut with the propagation direction of 50° to the X axis.
Keywords
pressure measurement; quartz; stress measurement; surface acoustic wave resonators; surface acoustic wave sensors; torque measurement; SAW resonators; crystal quartz; pressure measurement; quartz substrate; reflection coefficient; resonator layouts; stress measurement; temperature dependence; torque measurement; torque sensitivity; torque sensors; wave propagation; Reflection; Sensitivity; Shafts; Surface acoustic waves; Temperature measurement; Temperature sensors; Torque; SAW; quartz; resonator; sensor; temperature dependence; torque; torque sensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location
San Diego, CA
ISSN
1948-5719
Print_ISBN
978-1-4577-0382-9
Type
conf
DOI
10.1109/ULTSYM.2010.5935489
Filename
5935489
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