• DocumentCode
    1952304
  • Title

    Spectroscopic measurements of ion source divergence in a high-power applied-B ion diode

  • Author

    Filuk, A.B. ; Bailey, J.E. ; Carlson, A.L. ; Clark, B.F. ; Lake, P. ; Tisone, G. ; Maron, Y.C.

  • Author_Institution
    Sandia Nat. Lab., Albuquerque, NM, USA
  • fYear
    1993
  • fDate
    7-9 June 1993
  • Firstpage
    201
  • Abstract
    Summary form only given. State-of-the-art space- and time-resolved visible spectroscopy measurements have been performed in the anode-cathode (AK) gap of the high-power applied-B ion diode of the particle beam fusion accelerator II (PBFA II) to study the energy of ions and atoms transverse to the direction of acceleration. The line profiles show strong broadening and shifting in general. These profiles can be affected by mechanisms such as Stark shifting. Stark broadening, Zeeman splitting, opacity effects, instrument broadening, and Doppler broadening. One goal of this study is to extract the Doppler broadening of ion and atom lines in order to obtain the ion beam divergence at the ion source. The readily observable Li I 2s-2p (6708 /spl Aring/) emission in the AK gap is examined with both passive and active lithium ion sources. The time of arrival at different radii indicates fast (/spl sim/50 cm/ /spl mu/s) Li I propagation away from the anode into the AK gap.
  • Keywords
    plasma diodes; 6708 A; Doppler broadening; Li I 2s-2p emission; Li I propagation; PBFA II; Stark broadening; Stark shifting; Zeeman splitting; anode-cathode gap; high-power applied-B ion diode; instrument broadening; ion source divergence; line profiles; opacity effects; particle beam fusion accelerator II; visible spectroscopy measurements; Atomic beams; Atomic measurements; Diodes; Energy measurement; Ion sources; Particle beam measurements; Particle beams; Particle measurements; Performance evaluation; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
  • Conference_Location
    Vancouver, BC, Canada
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-1360-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.1993.593549
  • Filename
    593549