• DocumentCode
    1952464
  • Title

    Environmental concerns and materials issues in manufactured solder joints

  • Author

    Gibson, A.W. ; Choi, S. ; Bieler, T.R. ; Subramanian, K.N.

  • Author_Institution
    Dept. of Mater. Sci. & Mech., Michigan State Univ., East Lansing, MI, USA
  • fYear
    1997
  • fDate
    5-7 May 1997
  • Firstpage
    246
  • Lastpage
    251
  • Abstract
    Environmental concerns, increasing complexity, and demands for reliability of solder joints in electronic systems provide an impetus to find alternatives to existing lead-tin solder and fluxes in common use. Several practical obstacles need to be overcome before an alternative to lead containing solder systems can be reliably implemented for electronic applications. Also new solders will have different failure criteria that must be established. A strategy for developing composite solders that permit tailoring the mechanical properties for the application, as well as stabilizing the microstructure to achieve optimal performance under service conditions is described. Stabilizing the microstructure will prevent mechanical property evolution over the life of the component, and this would substantially simplify the prediction of solder joint lifetimes. A research program to develop relevant quantitative descriptions of microstructural evolution and property variation in eutectic Sn-3.5%Ag solder with and without composite strengthening is summarized
  • Keywords
    circuit reliability; composite materials; creep; crystal microstructure; environmental factors; eutectic alloys; failure analysis; soldering; thermal expansion; thermal stress cracking; thermal stresses; Sn-Ag; composite solders; composite strengthening; environmental concerns; eutectic Sn-Ag solder; failure criteria; lead-free solders; manufactured solder joints; materials issues; mechanical properties; microstructure stabilisation; reliability; solder joint lifetime prediction; Electronic components; Environmentally friendly manufacturing techniques; Joining materials; Lead; Mechanical factors; Microstructure; Predictive models; Soldering; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and the Environment, 1997. ISEE-1997., Proceedings of the 1997 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3808-1
  • Type

    conf

  • DOI
    10.1109/ISEE.1997.605328
  • Filename
    605328