Title :
High-stability SAW oscillators with cubic frequency temperature curve and excellent aging characteristics
Author :
Yamanaka, Kunihito ; Obata, Naohisa ; Morita, Takao ; Maeda, Yoshio ; Kanna, Shigeo
Author_Institution :
Epson Toyocom Corp., Hino, Japan
Abstract :
We describe the realization of oscillators combined with quartz´s innate excellent long-term stability of frequency and frequency temperature characteristics by optimization of SAW oscillator´s design conditions using quartz crystal substrates in application on groove structure. As a result, we could realize SAW oscillator with cubic frequency temperature curve, inflection point temperature of 28°C that is close to a room temperature and extremely small frequency variation of llppm in wide temperature range between -40 °C and +85 °C. Further, we could get excellent long-term stability lower than 3 ppm of frequency variation in 2000 hours high temperature environment test with 85°C. SAW resonator that is making up oscillator has gained good resonance characteristics such as Q = 14,700 and CI = 12 Ω with 400 MHz. We realized high-performance SAW oscillator on practical use with characteristics such as low jitter and low phase noise, in addition excelling in frequency temperature characteristics and frequency long-term stability by oscillating fundamental wave in high-frequency range with 100 MHz to 700 MHz.
Keywords :
UHF oscillators; acoustic microwave devices; ageing; circuit stability; phase noise; surface acoustic wave oscillators; aging characteristics; cubic frequency temperature curve; frequency 100 MHz to 700 MHz; frequency long-term stability; groove structure; high temperature environment test; high-stability SAW oscillators; inflection point temperature; low jitter; low phase noise; quartz crystal substrates; quartz innate; resistance 12 ohm; temperature -40 degC to 85 degC; temperature 28 degC; temperature 293 K to 298 K; time 2000 hour; Electrodes; Oscillators; Resonant frequency; Surface acoustic waves; Temperature distribution; Thermal stability; Aging; Frequency-temperature; Oscillator; Quartz; SAW;
Conference_Titel :
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0382-9
DOI :
10.1109/ULTSYM.2010.5935511