DocumentCode :
1952816
Title :
200V multi RESURF trench MOSFET (MR-TMOS)
Author :
Kurosaki, T. ; Shishido, H. ; Kitada, M. ; Oshima, K. ; Kunori, S. ; Sugai, A.
fYear :
2003
fDate :
14-17 April 2003
Firstpage :
211
Lastpage :
214
Abstract :
In this paper, we propose a new structure of trench MOSFETs, named Multi RESURF Trench MOSFETs (MR-TMOS). This structure has a deep p type pillar under the trench gate electrode. This p type pillars are formed by using the method of filling trenches with epitaxial silicon. Using this technique, we have developed a 200V class low on-resistance MOSFETs with Ron˙A=4.8 mΩ˙cm2 at VG=10V and Vdss=245V. This experimental result shows superior characteristics and a relatively good agreement with the simulation result, Ron˙A=5.0 mΩ˙cm2 at VG=10V and Vdss=252V.
Keywords :
elemental semiconductors; power MOSFET; semiconductor device measurement; semiconductor device models; semiconductor epitaxial layers; silicon; 10 V; 200 V; 245 V; Si; deep p type pillar; epitaxial silicon; multi RESURF trench MOSFET; trench gate electrode; Boron; Computational modeling; Consumer electronics; Electrodes; Filling; MOSFET circuits; Power MOSFET; Power semiconductor devices; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on
Print_ISBN :
0-7803-7876-8
Type :
conf
DOI :
10.1109/ISPSD.2003.1225266
Filename :
1225266
Link To Document :
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