DocumentCode :
1952821
Title :
Nanometer scale thin-film-edge emitter devices with high current density characteristics
Author :
Akinwande, A.I. ; Bauhahn, P.E. ; Gray, H.F. ; Ohnstein, T.R. ; Holmen, J.O.
Author_Institution :
Sensor & Syst. Dev. Center, Honeywell Inc., Bloomington, MN, USA
fYear :
1992
fDate :
13-16 Dec. 1992
Firstpage :
367
Lastpage :
370
Abstract :
We report the demonstration of thin-film-edge emitter devices with reproducible high current density characteristics. The demonstrated devices include both diodes and triodes with thin film emitters, anodes and control electrodes on the same wafer. Contrasted with the usual vertical FEA structures, this particular triode design invokes two dimensional vertical symmetry for the extraction electrodes using multi-layer thin-film deposition and patterning techniques. Emission currents as high as 400 mu A per edge have been demonstrated and current densities as high as 10 mu A/ mu m of edge width.<>
Keywords :
current density; diodes; electron field emission; nanotechnology; triodes; vacuum microelectronics; 400 muA; control electrodes; current densities; dimensional vertical symmetry; diodes; emission currents; extraction electrodes; multi-layer thin-film deposition; nanometer scale thin-film-edge emitter devices; patterning; reproducible high current density characteristics; thin-film-edge emitter; triodes; Current density; Diodes; Electron emission; Electron tubes; Nanotechnology; Vacuum microelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0817-4
Type :
conf
DOI :
10.1109/IEDM.1992.307379
Filename :
307379
Link To Document :
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